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Journal of Inequalities and Applications
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Global Existence and Extinction of Weak Solutions to a Class of Semiconductor Equations with Fast Diffusion Terms

Journal of Inequalities and Applications volume 2008, Article number: 961045 (2008) Cite this article

Abstract

We consider the transient drift-diffusion model with fast diffusion terms. This problem is not only degenerate but also singular. We first present existence result for general nonlinear diffusivities for the Dirichlet-Neumann mixed boundary value problem. Then, the extinction phenomenon of weak solutions for the homogeneous Dirichlet boundary problem is studied. Sufficient conditions on the extinction and decay estimates of solutions are obtained by using -integral model estimate method.

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  1. Department of Information and Computing Sciences, College of Mathematics and Physics, Nanjing University of Information Science and Technology, Nanjing, 210044, China

    Bin Wu

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  1. Bin Wu
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Correspondence to Bin Wu.

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Open Access This article is distributed under the terms of the Creative Commons Attribution 2.0 International License (https://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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Wu, B. Global Existence and Extinction of Weak Solutions to a Class of Semiconductor Equations with Fast Diffusion Terms. J Inequal Appl 2008, 961045 (2008). https://doi.org/10.1155/2008/961045

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  • DOI: https://doi.org/10.1155/2008/961045

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